MP300 SC2 接触型 スパイツール

MP300 SC2は、銀行取引やモバイル取引のコンテキストで使用される安全な要素のシミュレーションに関する市場で最も完全なテストツールです。 さらに、組み込みスパイ機能は、相互運用性の問題を解決するための診断を確立するのに役立ちます。

  • 主な機能
  • 対応プロトコル
  • スパイ機能
  • 利用可能な試験

MP300 SC2の主な機能

  • protocol analysis of ISO 7816, SWP/HCI, I2C, DCLB, NFC-Wi protocols (low level, high level, bits, bytes, frames, transactions)
  • simultaneous protocol spy (for example, ISO 7816 vs SWP/HCI vs I2C)
  • analog measurement feature (voltage, current, on user selected pin)
  • simulation of secure elements following the ISO 7816, SWP/HCI, I2C, DCLB, NFC-Wi physical layers
  • open platform : user can customize all protocol (bit lengths, timings, …) and physical parameters (rise/fall times, voltages, current, …)
  • open platform : user can program any kind of test scenario, including errors (CRC, parity, timings, …)
  • various types of probes available (ID1, SIM, micro SIM, nano SIM, M2M, …)
  • off the shelf conformance test libraries available (ISO 7816, EMVCo, SWP/HCI (ETSI TS 102.694-1, ETSI TS 102.695-1 and ETSI TS 102.695-3))

対応プロトコル

  • ISO 7816-3

– T=0 and T=1 protocols : 100% implemented, managed by Firmware and FPGA

  • USB 2.0 (optionnal)

– Available speeds : Low speed, full speed
– Classes : ISO/IEC 7816-12, mass storage, custom protocols

  • SWP / HCI (ETSI TS 102.613, ETSI TS 102.622) (optionnal)

– SWP transmission : Assisted by hardware
– Supported baudrates : 49 kbps to 1,9Mbis
– LLC layers support : ACT, CLT and S-HDLC, by firmware

  • Spy of other secure elements (optionnal)

– NFC-Wi
– I2C (standard, fast, high speed modes)
– SPI

  • Raw mode

– Implementation of custom protocols, support of out of standard chips

スパイ機能

  • Accuracy : 20 ns
  • Signals displayed :

– All 8 pins (C1 C2 C3 C4 C6 C7 C8)
– SWP S1, S2
– USB
– Bytes
– Frames
– Trigger states

  • I2C start and stop conditions, ACK/NACK, SDA/SCL transitions
  • SPI SCK, MOSI, LISO, SS transitions
  • Analog information (current, voltage measurement)

利用可能な試験

Electrical tests
– Voltage measurement (static mode, burst mode)
– Current measurement (burst mode)

Logical test

– Simulation of all ISO 7816-3 T=0 and T=1 compliance scenario
– Support of all SWP/HCI comformance scenario (ETSI TS 102.694-1, ETSI TS 102.695-1, ETSI TS 102.695-3)
– Simulation of parity errors, CRC errors, all sort of timings

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